Scale-adaptive landmark detection, classification and size estimation in 3D object-background images.

G de Vries; PW Verbeek

Scale-adaptive landmark detection, classification and size estimation in 3D object-background images.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	ICPR15, Proc. 15th Int. Conference on Pattern Recognition
Editors	A Sanfeliu, JJ Villanueva, M Vanrell, R Alquezar, AK Jain, J Kittler
Place of Publication	Los Alamitos
Publisher	IEEE
Pages	1026-1029
Number of pages	4
ISBN (Print)	0-7695-0750-6
Publication status	Published - 2000
Event	Barcelona, Spain - Los Alamitos Duration: 3 Sept 2000 → 7 Sept 2000

Publication series

Name
Publisher	IEEE Computer Society Press

Name	International Conference on Pattern Recognition
Volume	3
ISSN (Print)	1051-4651

Conference

Conference	Barcelona, Spain
Period	3/09/00 → 7/09/00

Bibliographical note

ISSN: 1051-4651

Keywords

ZX Int.klas.verslagjaar < 2002

Cite this

@inproceedings{b4120a4a61d04c5ebf1c75242b1dfd03,

title = "Scale-adaptive landmark detection, classification and size estimation in 3D object-background images.",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "{de Vries}, G and PW Verbeek",

note = "ISSN: 1051-4651; Barcelona, Spain ; Conference date: 03-09-2000 Through 07-09-2000",

year = "2000",

language = "Undefined/Unknown",

isbn = "0-7695-0750-6",

publisher = "IEEE",

pages = "1026--1029",

editor = "A Sanfeliu and JJ Villanueva and M Vanrell and R Alquezar and AK Jain and J Kittler",

booktitle = "ICPR15, Proc. 15th Int. Conference on Pattern Recognition",

address = "United States",

}

de Vries, G & Verbeek, PW 2000, Scale-adaptive landmark detection, classification and size estimation in 3D object-background images. in A Sanfeliu, JJ Villanueva, M Vanrell, R Alquezar, AK Jain & J Kittler (eds), ICPR15, Proc. 15th Int. Conference on Pattern Recognition. International Conference on Pattern Recognition, vol. 3, IEEE, Los Alamitos, pp. 1026-1029, Barcelona, Spain, 3/09/00.

Scale-adaptive landmark detection, classification and size estimation in 3D object-background images. / de Vries, G; Verbeek, PW.
ICPR15, Proc. 15th Int. Conference on Pattern Recognition. ed. / A Sanfeliu; JJ Villanueva; M Vanrell; R Alquezar; AK Jain; J Kittler. Los Alamitos: IEEE, 2000. p. 1026-1029 (International Conference on Pattern Recognition; Vol. 3).

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

TY - GEN

T1 - Scale-adaptive landmark detection, classification and size estimation in 3D object-background images.

AU - de Vries, G

AU - Verbeek, PW

N1 - ISSN: 1051-4651

PY - 2000

Y1 - 2000

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7695-0750-6

SP - 1026

EP - 1029

BT - ICPR15, Proc. 15th Int. Conference on Pattern Recognition

A2 - Sanfeliu, A

A2 - Villanueva, JJ

A2 - Vanrell, M

A2 - Alquezar, R

A2 - Jain, AK

A2 - Kittler, J

PB - IEEE

CY - Los Alamitos

T2 - Barcelona, Spain

Y2 - 3 September 2000 through 7 September 2000

ER -