Scale-dependency of Thomsen parameters for layers with intermediate thickness

F Verhelst, CPA Wapenaar

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    2 Citations (Scopus)
    Original languageUndefined/Unknown
    Title of host publicationProc. 72nd annual SEG meeting, Salt Lake City, USA
    Number of pages4
    Publication statusPublished - 2002


    • conference contrib. refereed
    • Conf.proc. > 3 pag

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