Scanning gate microscopy measurements on a superconducting single-electron transistor

M Huefner, M Hilke, U Staufer

Research output: Contribution to journalArticleScientificpeer-review

20 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)134530-1-134530-8
JournalPhysical Review B (Condensed Matter and Materials Physics)
Volume79
Issue number13?
Publication statusPublished - 2009

Keywords

  • journal letters, notes, etc.
  • CWTS 0.75 <= JFIS < 2.00

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