Scanning gate microscopy measurements on a superconducting single-electron transistor

M Huefner, M Hilke, U Staufer

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	134530-1-134530-8
Journal	Physical Review B (Condensed Matter and Materials Physics)
Volume	79
Issue number	13?
Publication status	Published - 2009

Keywords

@article{63c810736e1b44feb89940d5f7253037,

title = "Scanning gate microscopy measurements on a superconducting single-electron transistor",

keywords = "journal letters, notes, etc., CWTS 0.75 <= JFIS < 2.00",

author = "M Huefner and M Hilke and U Staufer",

year = "2009",

language = "Undefined/Unknown",

volume = "79",

pages = "134530--1--134530--8",

journal = "Physical Review B (Condensed Matter and Materials Physics)",

issn = "1098-0121",

publisher = "American Physical Society",

number = "13?",

}

TY - JOUR

T1 - Scanning gate microscopy measurements on a superconducting single-electron transistor

AU - Huefner, M

AU - Hilke, M

AU - Staufer, U

PY - 2009

Y1 - 2009

KW - journal letters, notes, etc.

KW - CWTS 0.75 <= JFIS < 2.00

M3 - Article

SN - 1098-0121

VL - 79

SP - 134530-1-134530-8

JO - Physical Review B (Condensed Matter and Materials Physics)

JF - Physical Review B (Condensed Matter and Materials Physics)

IS - 13?

ER -