| Original language | Undefined/Unknown |
|---|---|
| Pages (from-to) | 40-48 |
| Number of pages | 9 |
| Journal | Materials Today |
| Volume | 11 |
| Publication status | Published - 2009 |
Keywords
- CWTS JFIS >= 2.00
Scanning probe microscopy at video-rate
G Schitter, MJ Rost
Research output: Contribution to journal › Article › Scientific › peer-review