Selecting feature lines in generalized dissimilarity representations for pattern recognition

Y Plasencia Calana, M Orozco-Alcazate, E García-Reyes, RPW Duin

Research output: Contribution to journalArticleScientificpeer-review

4 Citations (Scopus)
Original languageEnglish
Pages (from-to)902-911
Number of pages10
JournalDigital Signal Processing
Volume23
Issue number3
DOIs
Publication statusPublished - 2013

Keywords

  • CWTS JFIS < 0.75

Cite this