Selective sampling based on the variation in label assignments

P Juszczak; RPW Duin

Selective sampling based on the variation in label assignments

P Juszczak, RPW Duin

Multimedia Computing

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

7 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	ICPR2004; Proceedings of the 17th international conference on pattern recognition
Editors	J Kittler, M Petrou, m Nixon
Place of Publication	Los Alamitos
Publisher	IEEE Society
Pages	375-378
Number of pages	4
ISBN (Print)	0-7695-2128-2
Publication status	Published - 2004
Event	17th International conference on pattern recognition, Cambridge, UK - Los Alamitos Duration: 23 Aug 2004 → 26 Aug 2004

Publication series

Name
Publisher	IEEE

Name
Volume	3

Conference

Conference	17th International conference on pattern recognition, Cambridge, UK
Period	23/08/04 → 26/08/04

Keywords

Conf.proc. > 3 pag

Cite this

@inproceedings{df7bc8a1931d4b7ba747d2ca781625c7,

title = "Selective sampling based on the variation in label assignments",

keywords = "Conf.proc. > 3 pag",

author = "P Juszczak and RPW Duin",

year = "2004",

language = "Undefined/Unknown",

isbn = "0-7695-2128-2",

publisher = "IEEE Society",

pages = "375--378",

editor = "J Kittler and M Petrou and m Nixon",

booktitle = "ICPR2004; Proceedings of the 17th international conference on pattern recognition",

note = "17th International conference on pattern recognition, Cambridge, UK ; Conference date: 23-08-2004 Through 26-08-2004",

}

Selective sampling based on the variation in label assignments. / Juszczak, P; Duin, RPW.
ICPR2004; Proceedings of the 17th international conference on pattern recognition. ed. / J Kittler; M Petrou; m Nixon. Los Alamitos: IEEE Society, 2004. p. 375-378.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Selective sampling based on the variation in label assignments

AU - Juszczak, P

AU - Duin, RPW

PY - 2004

Y1 - 2004

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-7695-2128-2

SP - 375

EP - 378

BT - ICPR2004; Proceedings of the 17th international conference on pattern recognition

A2 - Kittler, J

A2 - Petrou, M

A2 - Nixon, m

PB - IEEE Society

CY - Los Alamitos

T2 - 17th International conference on pattern recognition, Cambridge, UK

Y2 - 23 August 2004 through 26 August 2004

ER -