Sensitive measurement method for evaluation of high thermal resistance in bipolar transistors

N Nenadovic; LK Nanver; H Schellevis; D de Mooij; V Zieren; JW Slotboom

Sensitive measurement method for evaluation of high thermal resistance in bipolar transistors

N Nenadovic, LK Nanver, H Schellevis, D de Mooij, V Zieren, JW Slotboom

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	ICMTS 2002 IEEE 2002 International Conference on Microelectronic Test Structures
Place of Publication	Piscataway, NJ. USA
Publisher	IEEE
Pages	77-82
Number of pages	6
ISBN (Print)	0-7803-7464-9
Publication status	Published - 2002
Event	ICMTS 2002, Cork, Ireland - Piscataway, NJ. USA Duration: 8 Apr 2002 → 11 Apr 2002

Publication series

Name
Publisher	IEEE

Conference

Conference	ICMTS 2002, Cork, Ireland
Period	8/04/02 → 11/04/02

Keywords

Conf.proc. > 3 pag
ZX Int.klas.verslagjaar < 2002

Cite this

@inproceedings{89680157fa2a444d8289bcbce021bd4b,

title = "Sensitive measurement method for evaluation of high thermal resistance in bipolar transistors",

keywords = "Conf.proc. > 3 pag, ZX Int.klas.verslagjaar < 2002",

author = "N Nenadovic and LK Nanver and H Schellevis and {de Mooij}, D and V Zieren and JW Slotboom",

year = "2002",

language = "Undefined/Unknown",

isbn = "0-7803-7464-9",

publisher = "IEEE",

pages = "77--82",

booktitle = "ICMTS 2002 IEEE 2002 International Conference on Microelectronic Test Structures",

address = "United States",

note = "ICMTS 2002, Cork, Ireland ; Conference date: 08-04-2002 Through 11-04-2002",

}

Sensitive measurement method for evaluation of high thermal resistance in bipolar transistors. / Nenadovic, N; Nanver, LK; Schellevis, H et al.
ICMTS 2002 IEEE 2002 International Conference on Microelectronic Test Structures. Piscataway, NJ. USA: IEEE, 2002. p. 77-82.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Sensitive measurement method for evaluation of high thermal resistance in bipolar transistors

AU - Nenadovic, N

AU - Nanver, LK

AU - Schellevis, H

AU - de Mooij, D

AU - Zieren, V

AU - Slotboom, JW

PY - 2002

Y1 - 2002

KW - Conf.proc. > 3 pag

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7803-7464-9

SP - 77

EP - 82

BT - ICMTS 2002 IEEE 2002 International Conference on Microelectronic Test Structures

PB - IEEE

CY - Piscataway, NJ. USA

T2 - ICMTS 2002, Cork, Ireland

Y2 - 8 April 2002 through 11 April 2002

ER -