Sensitivity analysis of RF measurements to detect PD in power cable accessories

S Meijer; RA Jongen; P Cichecki; PP Seitz; R Bodega; TJWH Hermans

doi:10.1109/CMD.2008.4580270

Sensitivity analysis of RF measurements to detect PD in power cable accessories

S Meijer, RA Jongen, P Cichecki, PP Seitz, R Bodega, TJWH Hermans

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	Proceedings of 2008 International conference on condition monitoring and diagnosis CMD 2008
Editors	s.n.
Place of Publication	Piscataway
Publisher	IEEE Society
Pages	1074-1077
Number of pages	4
ISBN (Print)	978-1-4244-1621-9
DOIs	https://doi.org/10.1109/CMD.2008.4580270
Publication status	Published - 2008
Event	2008 International conference on condition monitoring and diagnosis, CMD 2008, Beijing China - Piscataway Duration: 21 Apr 2008 → 24 Apr 2008

Publication series

Name
Publisher	IEEE

Conference

Conference	2008 International conference on condition monitoring and diagnosis, CMD 2008, Beijing China
Period	21/04/08 → 24/04/08

Keywords

conference contrib. refereed
Conf.proc. > 3 pag

Access to Document

10.1109/CMD.2008.4580270

Cite this

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title = "Sensitivity analysis of RF measurements to detect PD in power cable accessories",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "S Meijer and RA Jongen and P Cichecki and PP Seitz and R Bodega and TJWH Hermans",

year = "2008",

doi = "10.1109/CMD.2008.4580270",

language = "Undefined/Unknown",

isbn = "978-1-4244-1621-9",

publisher = "IEEE Society",

pages = "1074--1077",

editor = "s.n.",

booktitle = "Proceedings of 2008 International conference on condition monitoring and diagnosis CMD 2008",

note = "null ; Conference date: 21-04-2008 Through 24-04-2008",

}

Meijer, S, Jongen, RA, Cichecki, P, Seitz, PP, Bodega, R & Hermans, TJWH 2008, Sensitivity analysis of RF measurements to detect PD in power cable accessories. in s.n. (ed.), Proceedings of 2008 International conference on condition monitoring and diagnosis CMD 2008. IEEE Society, Piscataway, pp. 1074-1077, 2008 International conference on condition monitoring and diagnosis, CMD 2008, Beijing China, 21/04/08. https://doi.org/10.1109/CMD.2008.4580270

Sensitivity analysis of RF measurements to detect PD in power cable accessories. / Meijer, S; Jongen, RA; Cichecki, P; Seitz, PP; Bodega, R; Hermans, TJWH.

Proceedings of 2008 International conference on condition monitoring and diagnosis CMD 2008. ed. / s.n. Piscataway : IEEE Society, 2008. p. 1074-1077.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Sensitivity analysis of RF measurements to detect PD in power cable accessories

AU - Meijer, S

AU - Jongen, RA

AU - Cichecki, P

AU - Seitz, PP

AU - Bodega, R

AU - Hermans, TJWH

PY - 2008

Y1 - 2008

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

U2 - 10.1109/CMD.2008.4580270

DO - 10.1109/CMD.2008.4580270

M3 - Conference contribution

SN - 978-1-4244-1621-9

SP - 1074

EP - 1077

BT - Proceedings of 2008 International conference on condition monitoring and diagnosis CMD 2008

A2 - s.n., null

PB - IEEE Society

CY - Piscataway

Y2 - 21 April 2008 through 24 April 2008

ER -