Sensitivity computation using domain-decomposititon for boundary element method base capacitance extractors

Y Bi, KJ van der Kolk, NP van der Meijs

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageUndefined/Unknown
Title of host publicationCICC 2009 Proceedings of the IEEE 2009 Custom Integrated Circuits Conference
EditorsD Nairn, J Snyder, e.a.
Place of PublicationSan Jose, U.S.A.
PublisherIEEE Society
Pages423-426
Number of pages4
ISBN (Print)1-4244-4072-6
DOIs
Publication statusPublished - 2009
EventCiCC 2009, San Jose, U.S.A. - San Jose, U.S.A.
Duration: 13 Sep 200916 Sep 2009

Publication series

Name
PublisherIEEE

Conference

ConferenceCiCC 2009, San Jose, U.S.A.
Period13/09/0916/09/09

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

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