Sensitivity of 3-D CSI-EPT Reconstructions to Modelled EM Field Variations and Object Truncation

Reijer Leijsen; Wyger M. Brink; Rob Remis; Andrew Webb

Sensitivity of 3-D CSI-EPT Reconstructions to Modelled EM Field Variations and Object Truncation

Reijer Leijsen, Wyger M. Brink, Rob Remis, Andrew Webb

Signal Processing Systems

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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Abstract

Model-based electrical properties tomography (EPT; [1,2]) reconstruction with 3-D Contrast Source Inversion-EPT (CSI-EPT; [3,4]) has high potential, but is inherently sensitive to small errors in the model used. Here we assess its sensitivity to errors in the incident electromagnetic (EM) fields due to coupling of the coil to the sample (loading effect), errors in the total EM fields due to errors in mapping methods, and the effect of different object truncations.

Original language	English
Title of host publication	2nd International Workshop on MR-based Electrical Properties Tomography
Subtitle of host publication	March 13th-16th 2019 University Medical Center Utrecht The Netherlands
Number of pages	2
Publication status	Published - 2019
Event	2nd International Workshop on MR-based Electrical Properties Tomography - Utrecht, Netherlands Duration: 13 Mar 2019 → 16 Mar 2019 Conference number: 2

Workshop

Workshop	2nd International Workshop on MR-based Electrical Properties Tomography
Abbreviated title	IMEP 2019
Country/Territory	Netherlands
City	Utrecht
Period	13/03/19 → 16/03/19

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@inproceedings{a36d3c1b0e2d496691fe0df7b900db85,

title = "Sensitivity of 3-D CSI-EPT Reconstructions to Modelled EM Field Variations and Object Truncation",

abstract = "Model-based electrical properties tomography (EPT; [1,2]) reconstruction with 3-D Contrast Source Inversion-EPT (CSI-EPT; [3,4]) has high potential, but is inherently sensitive to small errors in the model used. Here we assess its sensitivity to errors in the incident electromagnetic (EM) fields due to coupling of the coil to the sample (loading effect), errors in the total EM fields due to errors in mapping methods, and the effect of different object truncations.",

author = "Reijer Leijsen and Brink, {Wyger M.} and Rob Remis and Andrew Webb",

year = "2019",

language = "English",

booktitle = "2nd International Workshop on MR-based Electrical Properties Tomography",

note = "2nd International Workshop on MR-based<br/>Electrical Properties Tomography, IMEP 2019 ; Conference date: 13-03-2019 Through 16-03-2019",

}

Leijsen, R, Brink, WM, Remis, R & Webb, A 2019, Sensitivity of 3-D CSI-EPT Reconstructions to Modelled EM Field Variations and Object Truncation. in 2nd International Workshop on MR-based Electrical Properties Tomography: March 13th-16th 2019 University Medical Center Utrecht The Netherlands. 2nd International Workshop on MR-based
Electrical Properties Tomography, Utrecht, Netherlands, 13/03/19.

Sensitivity of 3-D CSI-EPT Reconstructions to Modelled EM Field Variations and Object Truncation. / Leijsen, Reijer; Brink, Wyger M.; Remis, Rob et al.
2nd International Workshop on MR-based Electrical Properties Tomography: March 13th-16th 2019 University Medical Center Utrecht The Netherlands. 2019.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Sensitivity of 3-D CSI-EPT Reconstructions to Modelled EM Field Variations and Object Truncation

AU - Leijsen, Reijer

AU - Brink, Wyger M.

AU - Remis, Rob

AU - Webb, Andrew

N1 - Conference code: 2

PY - 2019

Y1 - 2019

N2 - Model-based electrical properties tomography (EPT; [1,2]) reconstruction with 3-D Contrast Source Inversion-EPT (CSI-EPT; [3,4]) has high potential, but is inherently sensitive to small errors in the model used. Here we assess its sensitivity to errors in the incident electromagnetic (EM) fields due to coupling of the coil to the sample (loading effect), errors in the total EM fields due to errors in mapping methods, and the effect of different object truncations.

AB - Model-based electrical properties tomography (EPT; [1,2]) reconstruction with 3-D Contrast Source Inversion-EPT (CSI-EPT; [3,4]) has high potential, but is inherently sensitive to small errors in the model used. Here we assess its sensitivity to errors in the incident electromagnetic (EM) fields due to coupling of the coil to the sample (loading effect), errors in the total EM fields due to errors in mapping methods, and the effect of different object truncations.

M3 - Conference contribution

BT - 2nd International Workshop on MR-based Electrical Properties Tomography

T2 - 2nd International Workshop on MR-based<br/>Electrical Properties Tomography

Y2 - 13 March 2019 through 16 March 2019

ER -

Sensitivity of 3-D CSI-EPT Reconstructions to Modelled EM Field Variations and Object Truncation

Abstract

Workshop

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