Series resistance optimization of high-sensitivity Si-based VUV photodiodes

L Shi, LK Nanver, A Sakic, T Knezevic, S Nihtianov, A Gottwald, U Kroth

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

4 Citations (Scopus)
Original languageEnglish
Title of host publication2011 IEEE Instrumentation and Measurement Technology Conference (I2MTC)
EditorsH Zhang, K Lee, Y Yan, R Dyer
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages1-4
Number of pages4
ISBN (Print)978-1-4244-7935-1
DOIs
Publication statusPublished - 2011
Event2011 IEEE Instrumentation and Measurement Technology Conference (I2MTC) - Piscataway, NJ, USA
Duration: 10 May 201112 May 2011

Publication series

Name
PublisherIEEE

Conference

Conference2011 IEEE Instrumentation and Measurement Technology Conference (I2MTC)
Period10/05/1112/05/11

Keywords

  • Conf.proc. > 3 pag

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