Series Resistance Optimization of High-Sensitivity Si-based VUV Photodiodes

L Shi, LK Nanver, A Sakic, S Nihtianov, T Knezevic, A Gottwald, U Kroth

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

4 Citations (Scopus)
Original languageEnglish
Title of host publicationIEEE International Instrumentation and Measurement Technology Conference
EditorsH Zhang, K Lee, Y Yan, R Dyer
Place of PublicationHangzhou, China
PublisherIEEE Society
Pages1-4
Number of pages4
ISBN (Print)978-1-4244-7935-1
DOIs
Publication statusPublished - 2011
EventIEEE 12MTC 2011 - Hangzhou, China
Duration: 12 May 201112 May 2011

Publication series

Name
PublisherIEEE

Conference

ConferenceIEEE 12MTC 2011
Period12/05/1112/05/11

Keywords

  • Elektrotechniek
  • Techniek

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