Series Resistance Optimization of High-Sensitivity Si-based VUV Photodiodes

L Shi; LK Nanver; A Sakic; S Nihtianov; T Knezevic; A Gottwald; U Kroth

doi:IMTC.2011.5944073

Series Resistance Optimization of High-Sensitivity Si-based VUV Photodiodes

L Shi, LK Nanver, A Sakic, S Nihtianov, T Knezevic, A Gottwald, U Kroth

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

6 Citations (Scopus)

Original language	English
Title of host publication	IEEE International Instrumentation and Measurement Technology Conference
Editors	H Zhang, K Lee, Y Yan, R Dyer
Place of Publication	Hangzhou, China
Publisher	IEEE
Pages	1-4
Number of pages	4
ISBN (Print)	978-1-4244-7935-1
DOIs	https://doi.org/IMTC.2011.5944073
Publication status	Published - 2011
Event	IEEE 12MTC 2011 - Hangzhou, China Duration: 12 May 2011 → 12 May 2011

Publication series

Name
Publisher	IEEE

Conference

Conference	IEEE 12MTC 2011
Period	12/05/11 → 12/05/11

Keywords

Elektrotechniek
Techniek

Access to Document

IMTC.2011.5944073

Cite this

@inproceedings{ab6f8dbd67b149a09cdb19cbb1fb75d7,

title = "Series Resistance Optimization of High-Sensitivity Si-based VUV Photodiodes",

keywords = "Elektrotechniek, Techniek",

author = "L Shi and LK Nanver and A Sakic and S Nihtianov and T Knezevic and A Gottwald and U Kroth",

year = "2011",

doi = "IMTC.2011.5944073",

language = "English",

isbn = "978-1-4244-7935-1",

publisher = "IEEE",

pages = "1--4",

editor = "H Zhang and K Lee and Y Yan and R Dyer",

booktitle = "IEEE International Instrumentation and Measurement Technology Conference",

address = "United States",

note = "IEEE 12MTC 2011 ; Conference date: 12-05-2011 Through 12-05-2011",

}

Shi, L, Nanver, LK, Sakic, A, Nihtianov, S, Knezevic, T, Gottwald, A & Kroth, U 2011, Series Resistance Optimization of High-Sensitivity Si-based VUV Photodiodes. in H Zhang, K Lee, Y Yan & R Dyer (eds), IEEE International Instrumentation and Measurement Technology Conference. IEEE, Hangzhou, China, pp. 1-4, IEEE 12MTC 2011, 12/05/11. https://doi.org/IMTC.2011.5944073

Series Resistance Optimization of High-Sensitivity Si-based VUV Photodiodes. / Shi, L; Nanver, LK; Sakic, A et al.
IEEE International Instrumentation and Measurement Technology Conference. ed. / H Zhang; K Lee; Y Yan; R Dyer. Hangzhou, China: IEEE, 2011. p. 1-4.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Series Resistance Optimization of High-Sensitivity Si-based VUV Photodiodes

AU - Shi, L

AU - Nanver, LK

AU - Sakic, A

AU - Nihtianov, S

AU - Knezevic, T

AU - Gottwald, A

AU - Kroth, U

PY - 2011

Y1 - 2011

KW - Elektrotechniek

KW - Techniek

U2 - IMTC.2011.5944073

DO - IMTC.2011.5944073

M3 - Conference contribution

SN - 978-1-4244-7935-1

SP - 1

EP - 4

BT - IEEE International Instrumentation and Measurement Technology Conference

A2 - Zhang, H

A2 - Lee, K

A2 - Yan, Y

A2 - Dyer, R

PB - IEEE

CY - Hangzhou, China

T2 - IEEE 12MTC 2011

Y2 - 12 May 2011 through 12 May 2011

ER -