Shortest path reduction in a class of uniform fault tolerant networks

PD Joshi, S Hamdioui

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationProceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
EditorsM Ottavi, S Hamdioui
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages234-239
Number of pages6
ISBN (Print)978-1-4799-6154-2
DOIs
Publication statusPublished - 2014
EventDFT 2014, Amsterdam, Netherlands - Piscataway, NJ, USA
Duration: 1 Oct 20143 Oct 2014

Publication series

Name
PublisherIEEE

Conference

ConferenceDFT 2014, Amsterdam, Netherlands
Period1/10/143/10/14

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