Si adhesion interlayer effects in hydrogen passivated Si/W soft X-ray multilayer mirrors

MJH Kessels, J Verhoeven, FD Tichelaar, F Bijkerk

    Research output: Contribution to journalArticleScientificpeer-review

    3 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)1405-1408
    Number of pages4
    JournalSurface Science
    Volume600
    Issue number6
    Publication statusPublished - 2006

    Keywords

    • academic journal papers
    • CWTS 0.75 <= JFIS < 2.00

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