SiC MOSFET Threshold-Voltage Instability under High Temperature Aging

Yang Liu, Xianping Chen, ZhaoHui Zhao, ZhiGang Li, CaiTao Lu, JingGuo Zhang, Huaiyu Ye*, Sau Wee Koh, LiGen Wang, Guoqi Zhang

*Corresponding author for this work

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

6 Citations (Scopus)

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Engineering