Signal Disentanglement in In Vivo MR Spectroscopy: By Semi-Parametric Processing or bij Measurement?

H Rabeson; H. Ratiney; C Cudalbu; S Cavassila; E. Capobianco; R de Beer; D van Ormondt; D Graveron-Demilly

Signal Disentanglement in In Vivo MR Spectroscopy: By Semi-Parametric Processing or bij Measurement?

H Rabeson, H. Ratiney, C Cudalbu, S Cavassila, E. Capobianco, R de Beer, D van Ormondt, D Graveron-Demilly

ImPhys/Imaging Physics

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	Proceedings ProRISC 2006
Editors	STW
Place of Publication	Utrecht
Publisher	STW
Pages	176-183
Number of pages	8
ISBN (Print)	90-73461-44-8
Publication status	Published - 2006
Event	17th An. Workshop on Circuits, Systems and Signal Processing, Veldhoven, Nederland - Utrecht Duration: 23 Nov 2006 → 24 Nov 2006

Publication series

Name
Publisher	STW

Conference

Conference	17th An. Workshop on Circuits, Systems and Signal Processing, Veldhoven, Nederland
Period	23/11/06 → 24/11/06

Keywords

Vakpubl., Overig wet. > 3 pag

Cite this

@inproceedings{97b6fab7314d49faa72138a21ef6da8c,

title = "Signal Disentanglement in In Vivo MR Spectroscopy: By Semi-Parametric Processing or bij Measurement?",

keywords = "Vakpubl., Overig wet. > 3 pag",

author = "H Rabeson and H. Ratiney and C Cudalbu and S Cavassila and E. Capobianco and {de Beer}, R and {van Ormondt}, D and D Graveron-Demilly",

year = "2006",

language = "Undefined/Unknown",

isbn = "90-73461-44-8",

publisher = "STW",

pages = "176--183",

editor = "STW",

booktitle = "Proceedings ProRISC 2006",

note = "17th An. Workshop on Circuits, Systems and Signal Processing, Veldhoven, Nederland ; Conference date: 23-11-2006 Through 24-11-2006",

}

Rabeson, H, Ratiney, H, Cudalbu, C, Cavassila, S, Capobianco, E, de Beer, R, van Ormondt, D & Graveron-Demilly, D 2006, Signal Disentanglement in In Vivo MR Spectroscopy: By Semi-Parametric Processing or bij Measurement? in STW (ed.), Proceedings ProRISC 2006. STW, Utrecht, pp. 176-183, 17th An. Workshop on Circuits, Systems and Signal Processing, Veldhoven, Nederland, 23/11/06.