Signal separator for Multi electron beam inspection apparatus

Pieter Kruit (Inventor), Ron Naftali (Inventor)

    Research output: Patent

    Original languageEnglish
    Patent numberUS 10,504,687
    IPCH01J
    Priority date20/02/18
    Publication statusPublished - 2019

    Bibliographical note

    Patent: OCT-16-085
    applicant: TU Delft

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