Simplified Procedures for COTS TID Testing: A Comparison between 90Sr and 60Co

Alessandra Menicucci, Fabio Malatesta, Francesco Di Capua, Luigi Campajola, Pierluigi Casolaro, Gianluca Furano, Stefano Di Mascio, Marco Ottavi

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

6 Citations (Scopus)
47 Downloads (Pure)


The tolerance to the cumulative effects of ionizing radiation is one of the most important parameters to keep into account when selecting an EEE component for space applications. TID sensitivity is normally investigated measuring changes induced by gamma rays from 60Co sources to nominal parameters of a component or to its expected functional behavior. In this work we propose an on-chip 90Sr/90Y electron source as an alternative methodology for TID tests.60Co and 90Sr/90Y TID test setups for a complex SoC are compared in terms of complexity and of experimental results, investigating the use of a 90Sr/90Y as well as the established 60Co. We show that 90Sr allows a simpler test setup, manages to reproduce specific modes of failure obtained with 60Co and causes failures at comparable total doses. This makes 90Sr an interesting alternative to 60Co qualification and the use of untested components, to be further investigated especially for complex COTS SoCs.
Original languageEnglish
Title of host publication2018 IEEE Nuclear and Space Radiation Effects Conference, NSREC 2018
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Number of pages6
ISBN (Electronic)9781538682630
Publication statusPublished - 19 Dec 2018
EventNSREC 2018: 2018 IEEE Nuclear and Space Radiation Effects Conference - Waikoloa, United States
Duration: 16 Jul 201820 Jul 2018


ConferenceNSREC 2018: 2018 IEEE Nuclear and Space Radiation Effects Conference
Abbreviated titleNSREC 2018
CountryUnited States


  • Cobalt
  • component
  • total dose


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