Simulation and development of short transparent tests for RAM

S Demidenko, AJ van de Goor, S Henderson, P Knoppers

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

10 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings
Editors	DC Young
Place of Publication	Los Alamitos
Publisher	IEEE
Pages	164-169
Number of pages	6
ISBN (Print)	0-7695-1378-6
Publication status	Published - 2001
Event	10th Asian Test Symposium, Kyoto - Los Alamitos Duration: 19 Nov 2001 → 21 Nov 2001

Name
Publisher	IEEE Computer Society

Conference	10th Asian Test Symposium, Kyoto
Period	19/11/01 → 21/11/01

Keywords

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title = "Simulation and development of short transparent tests for RAM",

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note = "null ; Conference date: 19-11-2001 Through 21-11-2001",

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AU - Demidenko, S

AU - van de Goor, AJ

AU - Henderson, S

AU - Knoppers, P

PY - 2001

Y1 - 2001

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7695-1378-6

SP - 164

EP - 169

BT - Proceedings

A2 - DC Young, null

PB - IEEE

CY - Los Alamitos

Y2 - 19 November 2001 through 21 November 2001

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