Simulation based analysis of temperature effect on the faulty behaviour of embedded DRAMs

Z Al-Ars, AJ van de Goor, J Braun, D Richter

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

12 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings
Place of Publication	Piscataway
Publisher	IEEE
Pages	783-792
Number of pages	10
ISBN (Print)	0-7803-7169-0
Publication status	Published - 2001
Event	International Test Conference 2001, Baltimore - Piscataway Duration: 30 Oct 2001 → 1 Nov 2001

Name
Publisher	IEEE

Conference	International Test Conference 2001, Baltimore
Period	30/10/01 → 1/11/01

Keywords

@inproceedings{508a6de3d8a04c2d9db2cde001bce160,

title = "Simulation based analysis of temperature effect on the faulty behaviour of embedded DRAMs",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "Z Al-Ars and {van de Goor}, AJ and J Braun and D Richter",

year = "2001",

language = "Undefined/Unknown",

isbn = "0-7803-7169-0",

publisher = "IEEE",

pages = "783--792",

booktitle = "Proceedings",

address = "United States",

note = "International Test Conference 2001, Baltimore ; Conference date: 30-10-2001 Through 01-11-2001",

}

TY - GEN

T1 - Simulation based analysis of temperature effect on the faulty behaviour of embedded DRAMs

AU - Al-Ars, Z

AU - van de Goor, AJ

AU - Braun, J

AU - Richter, D

PY - 2001

Y1 - 2001

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7803-7169-0

SP - 783

EP - 792

BT - Proceedings

PB - IEEE

CY - Piscataway

T2 - International Test Conference 2001, Baltimore

Y2 - 30 October 2001 through 1 November 2001

ER -