Simulation of ion imaging: Sputtering, contrast, noise

V Castaldo, CW Hagen, P Kruit

    Research output: Contribution to journalArticleScientificpeer-review

    3 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)982-994
    Number of pages13
    JournalUltramicroscopy
    Volume111
    Publication statusPublished - 2011

    Keywords

    • CWTS 0.75 <= JFIS < 2.00

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