TY - GEN
T1 - Simultaneous electrical, UHF, current and optical PD measurements on floating potential under DC stress
AU - Wenger, P.
AU - Abdul Madhar, S.
AU - Beltle, M.
PY - 2019
Y1 - 2019
N2 - In this contribution, the partial discharge behavior of two types of floating electrodes under DC stress in air at atmospheric pressure are investigated. Either a hexagonal-shaped nut or a sphere are positioned at a distance of 0.4 mm to the high voltage electrode. The influence of the geometry of the floating electrodes as well as the level and polarity of the applied DC voltage on the partial discharge activity are investigated. Several PD measurement techniques are used simultaneously, namely electrical measurement, ultra-high frequency (UHF) and both high frequency current transformer (HFCT) and shunt measurements. The obtained data is post-processed and visualized with Pulse Sequence Analysis (PSA) diagrams in order to provide characteristic patterns of the investigated defect. In addition, a corona camera detecting the light emissions generated by the discharges provide a further understanding of the defect mechanisms.
AB - In this contribution, the partial discharge behavior of two types of floating electrodes under DC stress in air at atmospheric pressure are investigated. Either a hexagonal-shaped nut or a sphere are positioned at a distance of 0.4 mm to the high voltage electrode. The influence of the geometry of the floating electrodes as well as the level and polarity of the applied DC voltage on the partial discharge activity are investigated. Several PD measurement techniques are used simultaneously, namely electrical measurement, ultra-high frequency (UHF) and both high frequency current transformer (HFCT) and shunt measurements. The obtained data is post-processed and visualized with Pulse Sequence Analysis (PSA) diagrams in order to provide characteristic patterns of the investigated defect. In addition, a corona camera detecting the light emissions generated by the discharges provide a further understanding of the defect mechanisms.
UR - http://www.scopus.com/inward/record.url?scp=85081669290&partnerID=8YFLogxK
U2 - 10.1109/CEIDP47102.2019.9010548
DO - 10.1109/CEIDP47102.2019.9010548
M3 - Conference contribution
T3 - Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
SP - 287
EP - 290
BT - 2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2019 - Proceedings
T2 - CEIDP 2019: Conference on Electrical Insulation and Dielectric Phenomena
Y2 - 20 October 2019 through 23 October 2019
ER -