TY - JOUR
T1 - Simultaneous scanning tunneling microscopy and synchrotron X-ray measurements in a gas environment
AU - Mom, Rik V.
AU - Onderwaater, Willem G.
AU - Rost, Marcel J.
AU - Jankowski, Maciej
AU - Wenzel, Sabine
AU - Jacobse, Leon
AU - Alkemade, Paul F.A.
AU - Vandalon, Vincent
AU - van Spronsen, Matthijs A.
AU - van Weeren, Matthijs
AU - Crama, Bert
AU - van der Tuijn, Peter
AU - Felici, Roberto
AU - Kessels, Wilhelmus M.M.
AU - Carlà, Francesco
AU - Frenken, Joost W.M.
AU - Groot, Irene M.N.
PY - 2017/11/1
Y1 - 2017/11/1
N2 - A combined X-ray and scanning tunneling microscopy (STM) instrument is presented that enables the local detection of X-ray absorption on surfaces in a gas environment. To suppress the collection of ion currents generated in the gas phase, coaxially shielded STM tips were used. The conductive outer shield of the coaxial tips can be biased to deflect ions away from the tip core. When tunneling, the X-ray-induced current is separated from the regular, ‘topographic’ tunneling current using a novel high-speed separation scheme. We demonstrate the capabilities of the instrument by measuring the local X-ray-induced current on Au(1 1 1) in 800 mbar Ar.
AB - A combined X-ray and scanning tunneling microscopy (STM) instrument is presented that enables the local detection of X-ray absorption on surfaces in a gas environment. To suppress the collection of ion currents generated in the gas phase, coaxially shielded STM tips were used. The conductive outer shield of the coaxial tips can be biased to deflect ions away from the tip core. When tunneling, the X-ray-induced current is separated from the regular, ‘topographic’ tunneling current using a novel high-speed separation scheme. We demonstrate the capabilities of the instrument by measuring the local X-ray-induced current on Au(1 1 1) in 800 mbar Ar.
KW - High-pressure surface science
KW - Operando catalysis research
KW - Scanning tunneling microscopy
KW - Synchrotron radiation
UR - http://www.scopus.com/inward/record.url?scp=85024906293&partnerID=8YFLogxK
U2 - 10.1016/j.ultramic.2017.07.011
DO - 10.1016/j.ultramic.2017.07.011
M3 - Article
AN - SCOPUS:85024906293
SN - 0304-3991
VL - 182
SP - 233
EP - 242
JO - Ultramicroscopy
JF - Ultramicroscopy
ER -