Simultaneous scanning tunneling microscopy and synchrotron X-ray measurements in a gas environment

Rik V. Mom^*, Willem G. Onderwaater, Marcel J. Rost, Maciej Jankowski, Sabine Wenzel, Leon Jacobse, Paul F.A. Alkemade, Vincent Vandalon, Matthijs A. van Spronsen, Matthijs van Weeren, Bert Crama, Peter van der Tuijn, Roberto Felici, Wilhelmus M.M. Kessels, Francesco Carlà, Joost W.M. Frenken, Irene M.N. Groot