Single Electron Precision in the Measurement of Charge Distributions on Electrically Biased Graphene Nanotips Using Electron Holography

Leonardo Vicarelli, Vadim Migunov*, Sairam K. Malladi, Henny W. Zandbergen, Rafal E. Dunin-Borkowski

*Corresponding author for this work

    Research output: Contribution to journalArticleScientificpeer-review

    4 Citations (Scopus)

    Abstract

    We use off-axis electron holography to measure the electrostatic charge density distributions on graphene-based nanogap devices that have thicknesses of between 1 and 10 monolayers and separations of between 8 and 58 nm with a precision of better than a single unit charge. Our experimental measurements, which are compared with finite element simulations, show that wider graphene tips, which have thicknesses of a single monolayer at their ends, exhibit charge accumulation along their edges. The results are relevant for both fundamental research on graphene electrostatics and applications of graphene nanogaps to single nucleotide detection in DNA sequencing, single molecule electronics, plasmonic antennae, and cold field emission sources.

    Original languageEnglish
    Pages (from-to)4091-4096
    Number of pages6
    JournalNano Letters
    Volume19
    Issue number6
    DOIs
    Publication statusPublished - 2019

    Keywords

    • Graphene
    • in situ transmission electron microscopy
    • nanogap
    • off-axis electron holography

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