Single grain TFTs and lateral photodiodes for large area X-ray detection

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Proceedings of the 2011 International Image Sensor Workshop (IISW)
Editors	N Teranishi, J Nakamura, S Kawahito, A Kobayashi
Pages	301-304
Number of pages	4
Publication status	Published - 2011
Event	International Image Sensor Workshop 2011 - Hokkaido, Japan Duration: 8 Jun 2011 → 11 Jun 2011

Conference	International Image Sensor Workshop 2011
Country/Territory	Japan
City	Hokkaido
Period	8/06/11 → 11/06/11

Keywords

@inproceedings{3303287c5b3143e8b04061c83b340cca,

title = "Single grain TFTs and lateral photodiodes for large area X-ray detection",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "A. Arslan and R. Ishihara and C.I.M. Beenakker",

year = "2011",

language = "English",

pages = "301--304",

editor = "N Teranishi and J Nakamura and S Kawahito and A Kobayashi",

booktitle = "Proceedings of the 2011 International Image Sensor Workshop (IISW)",

note = "International Image Sensor Workshop 2011<br/> ; Conference date: 08-06-2011 Through 11-06-2011",

}

Single grain TFTs and lateral photodiodes for large area X-ray detection. / Arslan, A.; Ishihara, R.; Beenakker, C.I.M.
Proceedings of the 2011 International Image Sensor Workshop (IISW). ed. / N Teranishi; J Nakamura; S Kawahito; A Kobayashi. 2011. p. 301-304.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Single grain TFTs and lateral photodiodes for large area X-ray detection

AU - Arslan, A.

AU - Ishihara, R.

AU - Beenakker, C.I.M.

PY - 2011

Y1 - 2011

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 301

EP - 304

BT - Proceedings of the 2011 International Image Sensor Workshop (IISW)

A2 - Teranishi, N

A2 - Nakamura, J

A2 - Kawahito, S

A2 - Kobayashi, A

T2 - International Image Sensor Workshop 2011<br/>

Y2 - 8 June 2011 through 11 June 2011

ER -