Single wafer surface micromachined field emission electron source

F Santagata; CK Yang; JF Creemer; PJ French; PM Sarro

Single wafer surface micromachined field emission electron source

F Santagata, CK Yang, JF Creemer, PJ French, PM Sarro

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

2 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Single wafer surface micromachined field emission electron source
Editors	PM Sarro, C Hierold
Place of Publication	sorento, italy
Publisher	IEEE Society
Pages	848-851
Number of pages	4
ISBN (Print)	978-1-4244-2978-3
Publication status	Published - 2009
Event	Single wafer surface micromachined field emission electron source - sorento, italy Duration: 25 Jan 2009 → 29 Jan 2009

Publication series

Name
Publisher	IEEE

Conference

Conference	Single wafer surface micromachined field emission electron source
Period	25/01/09 → 29/01/09

Keywords

conference contrib. refereed
Conf.proc. > 3 pag

Cite this

@inproceedings{f76cc5dd94a34172a228652aa9a648e6,

title = "Single wafer surface micromachined field emission electron source",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "F Santagata and CK Yang and JF Creemer and PJ French and PM Sarro",

year = "2009",

language = "Undefined/Unknown",

isbn = "978-1-4244-2978-3",

publisher = "IEEE Society",

pages = "848--851",

editor = "PM Sarro and C Hierold",

booktitle = "Single wafer surface micromachined field emission electron source",

note = "Single wafer surface micromachined field emission electron source ; Conference date: 25-01-2009 Through 29-01-2009",

}

Single wafer surface micromachined field emission electron source. / Santagata, F; Yang, CK; Creemer, JF et al.
Single wafer surface micromachined field emission electron source. ed. / PM Sarro; C Hierold. sorento, italy: IEEE Society, 2009. p. 848-851.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Single wafer surface micromachined field emission electron source

AU - Santagata, F

AU - Yang, CK

AU - Creemer, JF

AU - French, PJ

AU - Sarro, PM

PY - 2009

Y1 - 2009

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

UR - ftp://162.105.201.22/incoming/MEMS2009/PDFs/Papers/213_0846.pdf

M3 - Conference contribution

SN - 978-1-4244-2978-3

SP - 848

EP - 851

BT - Single wafer surface micromachined field emission electron source

A2 - Sarro, PM

A2 - Hierold, C

PB - IEEE Society

CY - sorento, italy

T2 - Single wafer surface micromachined field emission electron source

Y2 - 25 January 2009 through 29 January 2009

ER -

Single wafer surface micromachined field emission electron source

Publication series

Conference

Keywords

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Cite this