Size effects in the electrical transport of Si/SiGe devices induced by strain relaxation

PW Lukey, J Caro, T Zijlstra, EWJM van der Drift, S Radelaar

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Original languageUndefined/Unknown
Title of host publicationProceedings of the Second Workshop on Innovative Circuits and Systems for Nano Electronics
Number of pages7
Publication statusPublished - 1997

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