Size effects in the electrical transport of Si/SiGe devices induced by strain relaxation

PW Lukey, J Caro, T Zijlstra, EWJM van der Drift, S Radelaar

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Original languageUndefined/Unknown
Title of host publicationProceedings of the Second Workshop on Innovative Circuits and Systems for Nano Electronics
Pages47-53
Number of pages7
Publication statusPublished - 1997

Cite this

Lukey, PW., Caro, J., Zijlstra, T., van der Drift, EWJM., & Radelaar, S. (1997). Size effects in the electrical transport of Si/SiGe devices induced by strain relaxation. In Proceedings of the Second Workshop on Innovative Circuits and Systems for Nano Electronics (pp. 47-53)