Smoothing of X-ray diffraction data and K[alpha]2 elimination using penalized likelihood and the composite link model

JJ de Rooi, NM van der Pers, RWA Hendrikx, R Delhez, AJ Bottger, P.H.C. Eilers

    Research output: Contribution to journalArticleScientificpeer-review

    7 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)852-860
    Number of pages9
    JournalJournal of Applied Crystallography
    Volume47
    Issue number3
    DOIs
    Publication statusPublished - 2014

    Keywords

    • CWTS JFIS >= 2.00

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