Software metrics: Pitfalls and best practices

EM Bouwers, A van Deursen, J Visser

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)
Original languageEnglish
Title of host publicationProceedings 35th International Conference on Software Engineering
EditorsD Notkin, BHC Cheng, K Pohl
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages1491-1492
Number of pages2
ISBN (Print)978-1-4673-3073-2
DOIs
Publication statusPublished - 2013
EventICSE 2013, San Francisco, CA, USA - Piscataway, NJ, USA
Duration: 18 May 201326 May 2013

Publication series

Name
PublisherIEEE

Conference

ConferenceICSE 2013, San Francisco, CA, USA
Period18/05/1326/05/13

Cite this

Bouwers, EM., van Deursen, A., & Visser, J. (2013). Software metrics: Pitfalls and best practices. In D. Notkin, BHC. Cheng, & K. Pohl (Eds.), Proceedings 35th International Conference on Software Engineering (pp. 1491-1492). IEEE Society. https://doi.org/10.1109/ICSE.2013.6606755