TY - JOUR
T1 - Sol-gel/drop-coated micro-thick TiO2 memristors for γ-ray sensing
AU - Abunahla, Heba
AU - Jaoude, Maguy Abi
AU - O'Kelly, Curtis J.
AU - Mohammad, Baker
PY - 2016
Y1 - 2016
N2 - Sol-gel/drop-coated micro-thick TiO2 memristors were investigated and developed for low-power radiation sensing. Devices constructed with coated aluminum (Al) electrodes exhibited unipolar I-V characteristics with dynamic turn-on voltage, and progressive ROFF/RON ratio loss under applied bias. Endurance failure of micro-thick Al/Al stacks is ascribed to gradual passivation of Al surface resulting from an electrically-enhanced oxygen-ion diffusion. By exchanging a single Al contact with higher work function copper (Cu) metal, two distinct superimposed TiO2 phases were formed. The TiO2 coating on Al surface was carbon-contaminated and amorphous, while that on Cu was found to be additionally doped with Cu(I/II) ions resulting from the corrosion of the surface of the electrode by the amine-based gelation agent. After initial forming, the hybrid stack could achieve a bipolar memristance, with high ROFF/RON (up to 106), and over 10 switching cycles at low-operating voltages (±1 V). The enhanced memristive switching properties of Al/Cu devices are explained via cooperative valence-change/electrochemical-metallization processes, involving migration of oxygen and copper species. The advanced micro-thick TiO2 memristors were exposed to Cs-137 γ-rays, providing for the first time initial insights into their radiation detection capabilities. The sensing mechanism through these devices could be actuated by synergistic radiation-induced and field-driven photo-electric effects.
AB - Sol-gel/drop-coated micro-thick TiO2 memristors were investigated and developed for low-power radiation sensing. Devices constructed with coated aluminum (Al) electrodes exhibited unipolar I-V characteristics with dynamic turn-on voltage, and progressive ROFF/RON ratio loss under applied bias. Endurance failure of micro-thick Al/Al stacks is ascribed to gradual passivation of Al surface resulting from an electrically-enhanced oxygen-ion diffusion. By exchanging a single Al contact with higher work function copper (Cu) metal, two distinct superimposed TiO2 phases were formed. The TiO2 coating on Al surface was carbon-contaminated and amorphous, while that on Cu was found to be additionally doped with Cu(I/II) ions resulting from the corrosion of the surface of the electrode by the amine-based gelation agent. After initial forming, the hybrid stack could achieve a bipolar memristance, with high ROFF/RON (up to 106), and over 10 switching cycles at low-operating voltages (±1 V). The enhanced memristive switching properties of Al/Cu devices are explained via cooperative valence-change/electrochemical-metallization processes, involving migration of oxygen and copper species. The advanced micro-thick TiO2 memristors were exposed to Cs-137 γ-rays, providing for the first time initial insights into their radiation detection capabilities. The sensing mechanism through these devices could be actuated by synergistic radiation-induced and field-driven photo-electric effects.
KW - Electrical characterization
KW - Irradiation effects
KW - Oxides
KW - Semiconductors
KW - Sol-gel growth
KW - Thin films
UR - http://www.scopus.com/inward/record.url?scp=84994491872&partnerID=8YFLogxK
U2 - 10.1016/j.matchemphys.2016.09.027
DO - 10.1016/j.matchemphys.2016.09.027
M3 - Article
AN - SCOPUS:84994491872
SN - 0254-0584
VL - 184
SP - 72
EP - 81
JO - Materials Chemistry and Physics
JF - Materials Chemistry and Physics
ER -