Space for substrate resistance extraction; modeling and verification of coupling problems

NP van der Meijs

Space for substrate resistance extraction; modeling and verification of coupling problems

Signal Processing Systems

Research output: Chapter in Book/Conference proceedings/Edited volume › Chapter › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	European mixed-signal initiative for electronic systems design; substrate noise coupling in mixed-signal ASICs
Editors	S Donnay, G Gielen
Place of Publication	Boston
Publisher	Kluwer Academic
Pages	65-92
Number of pages	28
ISBN (Print)	1-4020-7381-X
Publication status	Published - 2003

Keywords

Boekdeel internat.wet

Cite this

@inbook{13db1020990a4ecf861143a3a06cb373,

title = "Space for substrate resistance extraction; modeling and verification of coupling problems",

keywords = "Boekdeel internat.wet",

author = "{van der Meijs}, NP",

year = "2003",

language = "Undefined/Unknown",

isbn = "1-4020-7381-X",

pages = "65--92",

editor = "S Donnay and G Gielen",

booktitle = "European mixed-signal initiative for electronic systems design; substrate noise coupling in mixed-signal ASICs",

publisher = "Kluwer Academic",

}

Space for substrate resistance extraction; modeling and verification of coupling problems. / van der Meijs, NP.

European mixed-signal initiative for electronic systems design; substrate noise coupling in mixed-signal ASICs. ed. / S Donnay; G Gielen. Boston : Kluwer Academic, 2003. p. 65-92.

Research output: Chapter in Book/Conference proceedings/Edited volume › Chapter › Scientific › peer-review

TY - CHAP

T1 - Space for substrate resistance extraction; modeling and verification of coupling problems

AU - van der Meijs, NP

PY - 2003

Y1 - 2003

KW - Boekdeel internat.wet

M3 - Chapter

SN - 1-4020-7381-X

SP - 65

EP - 92

BT - European mixed-signal initiative for electronic systems design; substrate noise coupling in mixed-signal ASICs

A2 - Donnay, S

A2 - Gielen, G

PB - Kluwer Academic

CY - Boston

ER -