Spatially Resolved Photoconductive Properties of Profiled Polycrystalline Silicon Thin Films

TJ Savenije, PATT van Veenendaal, MP de Haas, JM Warman, REI Schropp

Research output: Contribution to journal › Article › Scientific › peer-review

Keywords

@article{9cd25326ac074f12b5b9b140664f5d7f,

title = "Spatially Resolved Photoconductive Properties of Profiled Polycrystalline Silicon Thin Films",

keywords = "ZX CWTS 1.00 <= JFIS < 3.00",

author = "TJ Savenije and {van Veenendaal}, PATT and {de Haas}, MP and JM Warman and REI Schropp",

year = "2002",

language = "Undefined/Unknown",

volume = "91",

pages = "5671--5676",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "AIP Publishing",

}

TY - JOUR

T1 - Spatially Resolved Photoconductive Properties of Profiled Polycrystalline Silicon Thin Films

AU - Savenije, TJ

AU - van Veenendaal, PATT

AU - de Haas, MP

AU - Warman, JM

AU - Schropp, REI

PY - 2002

Y1 - 2002

KW - ZX CWTS 1.00 <= JFIS < 3.00

M3 - Article

SN - 0021-8979

VL - 91

SP - 5671

EP - 5676

JO - Journal of Applied Physics

JF - Journal of Applied Physics

ER -