Special issue on "advanced control methods for scanning probe microscopy"

G Schitter, K.J Astrom

Research output: Contribution to journalArticleScientificpeer-review

Original languageUndefined/Unknown
Pages (from-to)101-103
Number of pages3
JournalAsian Journal of Control
Volume11
Issue number2
Publication statusPublished - 2009

Keywords

  • CWTS JFIS < 0.75

Cite this