Special Session: STT-MRAMs: Technology, Design and Test

INIS

• design 100%
• devices 100%
• performance 100%
• power 66%
• applications 66%
• data 66%
• solutions 66%
• volatility 66%
• failures 33%
• operation 33%
• levels 33%
• metrics 33%
• demand 33%
• damage 33%
• scaling 33%
• leakage 33%
• silicon 33%
• space 33%
• density 33%
• defects 33%
• compatibility 33%
• modeling 33%

Engineering

• Design 100%
• Models 33%
• Test Solution 33%
• Metrics 33%
• Mechanisms 33%
• Scaling 33%
• Characteristics 33%
• Defects 33%
• Density 33%
• Failure (Mechanical) 33%
• Nonvolatile Memory 33%
• Induced Damage 33%
• Device Performance 33%
• Operating Requirement 33%
• Compatibility 33%
• Low Power Operation 33%

Computer Science

• Technology Design 100%
• Performance Metric 50%
• Embedded Application 50%
• Non-Volatile Memory 50%
• High-Performance Computing 50%