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Spectroscopic analysis through thermoelastic optical coherence microscopy
Aaron Doug Deen, Tom Pfeiffer, Heleen van Beusekom, Jeroen Essers, Antonius F.W. van der Steen, Robert Huber, Gijs van Soest, Tianshi Wang*
*Corresponding author for this work
Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review