SPICE simulation of single-electron electronics compared to measurement results

R van Haar, J Hoekstra

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	SAFE/ProRISC Proceedings 2003
Place of Publication	Utrecht
Publisher	Technology Foundation STW
Pages	190-194
Number of pages	5
ISBN (Print)	90-73461-39-1
Publication status	Published - 2003
Event	SAFE/ProRISC 2003 - Utrecht Duration: 25 Nov 2003 → 27 Nov 2003

Name
Publisher	Technology Foundation STW

Conference	SAFE/ProRISC 2003
Period	25/11/03 → 27/11/03

Keywords

@inproceedings{7af59ebaa6054869b4d2498993947577,

title = "SPICE simulation of single-electron electronics compared to measurement results",

keywords = "Elektrotechniek, Techniek, Vakpubl., Overig wet. > 3 pag",

author = "{van Haar}, R and J Hoekstra",

year = "2003",

language = "Undefined/Unknown",

isbn = "90-73461-39-1",

publisher = "Technology Foundation STW",

pages = "190--194",

booktitle = "SAFE/ProRISC Proceedings 2003",

note = "SAFE/ProRISC 2003 ; Conference date: 25-11-2003 Through 27-11-2003",

}

TY - GEN

T1 - SPICE simulation of single-electron electronics compared to measurement results

AU - van Haar, R

AU - Hoekstra, J

PY - 2003

Y1 - 2003

KW - Elektrotechniek

KW - Techniek

KW - Vakpubl., Overig wet. > 3 pag

M3 - Conference contribution

SN - 90-73461-39-1

SP - 190

EP - 194

BT - SAFE/ProRISC Proceedings 2003

PB - Technology Foundation STW

CY - Utrecht

T2 - SAFE/ProRISC 2003

Y2 - 25 November 2003 through 27 November 2003

ER -