Spur-free all-digital PLL in 65 nm for mobile phones

RB Staszewski; K Waheed; S Vemulapalli; F Dulger; J Walberg; CM Hung; O Eliezer

doi:10.1109/ISSCC.2011.5746215

Spur-free all-digital PLL in 65 nm for mobile phones

RB Staszewski, K Waheed, S Vemulapalli, F Dulger, J Walberg, CM Hung, O Eliezer

Electronics

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

27 Citations (Scopus)

Original language	English
Title of host publication	Digest of Technical Papers, 2011 IEEE International Solid-State Circuits Conference
Editors	LC Fujino et al.
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE
Pages	52-54
Number of pages	3
ISBN (Print)	978-1-61284-300-1
DOIs	https://doi.org/10.1109/ISSCC.2011.5746215
Publication status	Published - 2011
Event	2011 IEEE International Solid-State Circuits Conference, San Francisco, CA, USA - Piscataway, NJ, USA Duration: 20 Feb 2011 → 24 Feb 2011

Publication series

Name
Publisher	IEEE

Conference

Conference	2011 IEEE International Solid-State Circuits Conference, San Francisco, CA, USA
Period	20/02/11 → 24/02/11

Keywords

Geen BTA classificatie

Access to Document

10.1109/ISSCC.2011.5746215

Cite this

@inproceedings{9db57bd6ae2149f2874076e31b46c894,

title = "Spur-free all-digital PLL in 65 nm for mobile phones",

keywords = "Geen BTA classificatie",

author = "RB Staszewski and K Waheed and S Vemulapalli and F Dulger and J Walberg and CM Hung and O Eliezer",

year = "2011",

doi = "10.1109/ISSCC.2011.5746215",

language = "English",

isbn = "978-1-61284-300-1",

publisher = "IEEE",

pages = "52--54",

editor = "{Fujino et al.}, LC",

booktitle = "Digest of Technical Papers, 2011 IEEE International Solid-State Circuits Conference",

address = "United States",

note = "2011 IEEE International Solid-State Circuits Conference, San Francisco, CA, USA ; Conference date: 20-02-2011 Through 24-02-2011",

}

Staszewski, RB, Waheed, K, Vemulapalli, S, Dulger, F, Walberg, J, Hung, CM & Eliezer, O 2011, Spur-free all-digital PLL in 65 nm for mobile phones. in LC Fujino et al. (ed.), Digest of Technical Papers, 2011 IEEE International Solid-State Circuits Conference. IEEE, Piscataway, NJ, USA, pp. 52-54, 2011 IEEE International Solid-State Circuits Conference, San Francisco, CA, USA, 20/02/11. https://doi.org/10.1109/ISSCC.2011.5746215

Spur-free all-digital PLL in 65 nm for mobile phones. / Staszewski, RB; Waheed, K; Vemulapalli, S et al.
Digest of Technical Papers, 2011 IEEE International Solid-State Circuits Conference. ed. / LC Fujino et al. Piscataway, NJ, USA: IEEE, 2011. p. 52-54.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Spur-free all-digital PLL in 65 nm for mobile phones

AU - Staszewski, RB

AU - Waheed, K

AU - Vemulapalli, S

AU - Dulger, F

AU - Walberg, J

AU - Hung, CM

AU - Eliezer, O

PY - 2011

Y1 - 2011

KW - Geen BTA classificatie

U2 - 10.1109/ISSCC.2011.5746215

DO - 10.1109/ISSCC.2011.5746215

M3 - Conference contribution

SN - 978-1-61284-300-1

SP - 52

EP - 54

BT - Digest of Technical Papers, 2011 IEEE International Solid-State Circuits Conference

A2 - Fujino et al., LC

PB - IEEE

CY - Piscataway, NJ, USA

T2 - 2011 IEEE International Solid-State Circuits Conference, San Francisco, CA, USA

Y2 - 20 February 2011 through 24 February 2011

ER -