Stability characterization of high-sensitivity silicon-based EUV photodiodes in a detrimental industrial environment

L Shi; LK Nanver; S Nihtianov

doi:10.1109/IECON.2011.6119729

Stability characterization of high-sensitivity silicon-based EUV photodiodes in a detrimental industrial environment

L Shi, LK Nanver, S Nihtianov

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

9 Citations (Scopus)

Original language	English
Title of host publication	37th Annual Conference of the IEEE Industrial Electronics Society (IECON 2011)
Editors	X Yu, T Dillon, Y Ibrahim, E Chang
Place of Publication	Melbourne, Australia
Publisher	IEEE
Pages	2651-2656
Number of pages	6
DOIs	https://doi.org/10.1109/IECON.2011.6119729
Publication status	Published - 2011
Event	IECON 2011 - Melbourne, Australia Duration: 7 Nov 2011 → 10 Nov 2011

Publication series

Name
Publisher	IEEE

Conference

Conference	IECON 2011
Period	7/11/11 → 10/11/11

Keywords

conference contrib. refereed
Conf.proc. > 3 pag

Access to Document

10.1109/IECON.2011.6119729

Cite this

@inproceedings{72fcdf1d02fd4c77b1fb2b2510d3c339,

title = "Stability characterization of high-sensitivity silicon-based EUV photodiodes in a detrimental industrial environment",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "L Shi and LK Nanver and S Nihtianov",

year = "2011",

doi = "10.1109/IECON.2011.6119729",

language = "English",

publisher = "IEEE",

pages = "2651--2656",

editor = "X Yu and T Dillon and Y Ibrahim and E Chang",

booktitle = "37th Annual Conference of the IEEE Industrial Electronics Society (IECON 2011)",

address = "United States",

note = "IECON 2011 ; Conference date: 07-11-2011 Through 10-11-2011",

}

Shi, L, Nanver, LK & Nihtianov, S 2011, Stability characterization of high-sensitivity silicon-based EUV photodiodes in a detrimental industrial environment. in X Yu, T Dillon, Y Ibrahim & E Chang (eds), 37th Annual Conference of the IEEE Industrial Electronics Society (IECON 2011). IEEE, Melbourne, Australia, pp. 2651-2656, IECON 2011, 7/11/11. https://doi.org/10.1109/IECON.2011.6119729

Stability characterization of high-sensitivity silicon-based EUV photodiodes in a detrimental industrial environment. / Shi, L; Nanver, LK; Nihtianov, S.
37th Annual Conference of the IEEE Industrial Electronics Society (IECON 2011). ed. / X Yu; T Dillon; Y Ibrahim; E Chang. Melbourne, Australia: IEEE, 2011. p. 2651-2656.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Stability characterization of high-sensitivity silicon-based EUV photodiodes in a detrimental industrial environment

AU - Shi, L

AU - Nanver, LK

AU - Nihtianov, S

PY - 2011

Y1 - 2011

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

U2 - 10.1109/IECON.2011.6119729

DO - 10.1109/IECON.2011.6119729

M3 - Conference contribution

SP - 2651

EP - 2656

BT - 37th Annual Conference of the IEEE Industrial Electronics Society (IECON 2011)

A2 - Yu, X

A2 - Dillon, T

A2 - Ibrahim, Y

A2 - Chang, E

PB - IEEE

CY - Melbourne, Australia

T2 - IECON 2011

Y2 - 7 November 2011 through 10 November 2011

ER -