Stability characterization of high-sensitivity silicon-based EUV photodiodes in a detrimental industrial environment

L Shi, LK Nanver, S Nihtianov

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

6 Citations (Scopus)
Original languageEnglish
Title of host publication37th Annual Conference of the IEEE Industrial Electronics Society (IECON 2011)
EditorsX Yu, T Dillon, Y Ibrahim, E Chang
Place of PublicationMelbourne, Australia
PublisherIEEE Society
Pages2651-2656
Number of pages6
DOIs
Publication statusPublished - 2011
EventIECON 2011 - Melbourne, Australia
Duration: 7 Nov 201110 Nov 2011

Publication series

Name
PublisherIEEE

Conference

ConferenceIECON 2011
Period7/11/1110/11/11

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

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