Original language | English |
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Pages (from-to) | 1699-1707 |
Number of pages | 9 |
Journal | IEEE Sensors Journal |
Volume | 13 |
Issue number | 5 |
DOIs | |
Publication status | Published - 2013 |
Stability characterization of high-sensitivity silicon-based EUV photodiodes in a detrimental environment
L Shi, S Nihtianov, LK Nanver, F Scholze
Research output: Contribution to journal › Article › Scientific › peer-review
18
Citations
(Scopus)