Stability of silicon microfabricated pull-in voltage references

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	2002 Conference on precision electromagnetic measurements CPEM 2002
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE
Pages	172-173
Number of pages	2
ISBN (Print)	0-7803-7243-3
Publication status	Published - 2002
Event	2002 Conference on precision electromagnetic measurements, Ottawa, Canada - Piscataway, NJ, USA Duration: 16 Jun 2002 → 21 Jun 2002

Name
Publisher	IEEE

Conference	2002 Conference on precision electromagnetic measurements, Ottawa, Canada
Period	16/06/02 → 21/06/02

Keywords

@inproceedings{5ac6627860284c2cb54665e5cdd4f244,

title = "Stability of silicon microfabricated pull-in voltage references",

keywords = "Conf.proc. > 3 pag, ZX Int.klas.verslagjaar < 2002",

author = "{Machado da Rocha}, LA and RF Wolffenbuttel",

year = "2002",

language = "Undefined/Unknown",

isbn = "0-7803-7243-3",

publisher = "IEEE",

pages = "172--173",

booktitle = "2002 Conference on precision electromagnetic measurements CPEM 2002",

address = "United States",

note = "2002 Conference on precision electromagnetic measurements, Ottawa, Canada ; Conference date: 16-06-2002 Through 21-06-2002",

}

TY - GEN

T1 - Stability of silicon microfabricated pull-in voltage references

AU - Machado da Rocha, LA

AU - Wolffenbuttel, RF

PY - 2002

Y1 - 2002

KW - Conf.proc. > 3 pag

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7803-7243-3

SP - 172

EP - 173

BT - 2002 Conference on precision electromagnetic measurements CPEM 2002

PB - IEEE

CY - Piscataway, NJ, USA

T2 - 2002 Conference on precision electromagnetic measurements, Ottawa, Canada

Y2 - 16 June 2002 through 21 June 2002

ER -