Statistical Analysis of Diode Ideal Current Parameter Extraction Procedures

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Professional

Original language	Undefined/Unknown
Title of host publication	Proc. 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE 2009)
Editors	s.n.
Place of Publication	Veldhoven, The Netherlands
Publisher	STW
Pages	163-166
Number of pages	4
ISBN (Print)	978-90-73461-62-8
Publication status	Published - 2009
Event	SAFE 2009 - Veldhoven, The Netherlands Duration: 26 Dec 2009 → 27 Dec 2009

Name
Publisher	STW

Conference	SAFE 2009
Period	26/12/09 → 27/12/09

Keywords

@inproceedings{2d7ba4a6763a40b3b59f62732285573e,

title = "Statistical Analysis of Diode Ideal Current Parameter Extraction Procedures",

keywords = "Vakpubl., Overig wet. > 3 pag",

author = "V Milovanovic and {van der Toorn}, R",

year = "2009",

language = "Undefined/Unknown",

isbn = "978-90-73461-62-8",

publisher = "STW",

pages = "163--166",

editor = "s.n.",

booktitle = "Proc. 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE 2009)",

note = "SAFE 2009 ; Conference date: 26-12-2009 Through 27-12-2009",

}

Statistical Analysis of Diode Ideal Current Parameter Extraction Procedures. / Milovanovic, V; van der Toorn, R.
Proc. 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE 2009). ed. / s.n. Veldhoven, The Netherlands: STW, 2009. p. 163-166.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Professional

TY - GEN

T1 - Statistical Analysis of Diode Ideal Current Parameter Extraction Procedures

AU - Milovanovic, V

AU - van der Toorn, R

PY - 2009

Y1 - 2009

KW - Vakpubl., Overig wet. > 3 pag

M3 - Conference contribution

SN - 978-90-73461-62-8

SP - 163

EP - 166

BT - Proc. 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE 2009)

A2 - s.n., null

PB - STW

CY - Veldhoven, The Netherlands

T2 - SAFE 2009

Y2 - 26 December 2009 through 27 December 2009

ER -