Statistical Analysis of Diode Ideal Current Parameter Extraction Procedures

V Milovanovic, R van der Toorn

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionProfessional

Original languageUndefined/Unknown
Title of host publicationProc. 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE 2009)
Editors s.n.
Place of PublicationVeldhoven, The Netherlands
PublisherSTW
Pages163-166
Number of pages4
ISBN (Print)978-90-73461-62-8
Publication statusPublished - 2009
EventSAFE 2009 - Veldhoven, The Netherlands
Duration: 26 Dec 200927 Dec 2009

Publication series

Name
PublisherSTW

Conference

ConferenceSAFE 2009
Period26/12/0927/12/09

Keywords

  • Vakpubl., Overig wet. > 3 pag

Cite this

Milovanovic, V., & van der Toorn, R. (2009). Statistical Analysis of Diode Ideal Current Parameter Extraction Procedures. In s.n. (Ed.), Proc. 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE 2009) (pp. 163-166). STW.