Statistical experimental design for quantitative atomic resolution transmission electron microscopy

S van Aert, AJ den Dekker, A van den Bos, D Van Dyck

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	1-164
Number of pages	164
Journal	Advances in Imaging and Electron Physics
Volume	130
Publication status	Published - 2004

Keywords

@article{9bee0d650dea41faba4ccd08000901fb,

title = "Statistical experimental design for quantitative atomic resolution transmission electron microscopy",

keywords = "ZX CWTS JFIS < 1.00",

author = "{van Aert}, S and {den Dekker}, AJ and {van den Bos}, A and {Van Dyck}, D",

year = "2004",

language = "Undefined/Unknown",

volume = "130",

pages = "1--164",

journal = "Advances in Imaging and Electron Physics",

issn = "1076-5670",

publisher = "Academic Press",

}

TY - JOUR

T1 - Statistical experimental design for quantitative atomic resolution transmission electron microscopy

AU - van Aert, S

AU - den Dekker, AJ

AU - van den Bos, A

AU - Van Dyck, D

PY - 2004

Y1 - 2004

KW - ZX CWTS JFIS < 1.00

M3 - Article

SN - 1076-5670

VL - 130

SP - 1

EP - 164

JO - Advances in Imaging and Electron Physics

JF - Advances in Imaging and Electron Physics

ER -