Statistical reliability analysis of NBTI impact on FinFET SRAMs and mitigation technique using independent-gate devices

Y Wang, SD Cotofana, L Fang

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

28 Citations (Scopus)
Original languageEnglish
Title of host publicationACM International symposium on nanoscale architectures
Editors s.n.
Place of PublicationNew York
PublisherIEEE Society
Pages1-7
Number of pages7
Publication statusPublished - 2012
EventNANOARCH 2012 - New York
Duration: 4 Jul 20126 Jul 2012

Publication series

Name
PublisherIEEE

Conference

ConferenceNANOARCH 2012
Period4/07/126/07/12

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