Status and trends of silicon RF technology

JN Burghartz

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	13-19
Number of pages	7
Journal	Microelectronics Reliability
Volume	41
Issue number	1
Publication status	Published - 2001

Keywords

@article{fd8406ca6d70406b844cf739664c68ec,

title = "Status and trends of silicon RF technology",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "JN Burghartz",

year = "2001",

language = "Undefined/Unknown",

volume = "41",

pages = "13--19",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier",

number = "1",

}