Step-stress accelerated testing of high-power LED lamps based on subsystem isolation method

M Cai, D. Yang, K Tian, P Zhang, X Chen, L Liu, GQ Zhang

Research output: Contribution to journalArticleScientificpeer-review

35 Citations (Scopus)
Original languageEnglish
Pages (from-to)1784-1789
Number of pages6
JournalMicroelectronics Reliability
Volume55
Issue number9-10
DOIs
Publication statusPublished - 2015

Bibliographical note

Harvest
Available online 29-7-2015

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