Step-stress accelerated testing of high-power LED lamps based on subsystem isolation method

M Cai, D. Yang, K Tian, P Zhang, X Chen, L Liu, GQ Zhang

Research output: Contribution to journalArticleScientificpeer-review

32 Citations (Scopus)
Original languageEnglish
Pages (from-to)1784-1789
Number of pages6
JournalMicroelectronics Reliability
Issue number9-10
Publication statusPublished - 2015

Cite this