Step-stress accelerated testing of high-power LED lamps based on subsystem isolation method

M Cai, D. Yang, K Tian, P Zhang, X Chen, L Liu, GQ Zhang

Research output: Contribution to journal › Article › Scientific › peer-review

38 Citations (Scopus)

Original language	English
Pages (from-to)	1784-1789
Number of pages	6
Journal	Microelectronics Reliability
Volume	55
Issue number	9-10
DOIs	https://doi.org/10.1016/j.microrel.2015.06.147
Publication status	Published - 2015

Harvest
Available online 29-7-2015

Access to Document

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title = "Step-stress accelerated testing of high-power LED lamps based on subsystem isolation method",

author = "M Cai and D. Yang and K Tian and P Zhang and X Chen and L Liu and GQ Zhang",

note = "Harvest Available online 29-7-2015",

year = "2015",

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TY - JOUR

T1 - Step-stress accelerated testing of high-power LED lamps based on subsystem isolation method

AU - Cai, M

AU - Yang, D.

AU - Tian, K

AU - Zhang, P

AU - Chen, X

AU - Liu, L

AU - Zhang, GQ

N1 - Harvest Available online 29-7-2015

PY - 2015

Y1 - 2015

U2 - 10.1016/j.microrel.2015.06.147

DO - 10.1016/j.microrel.2015.06.147

M3 - Article

SN - 0026-2714

VL - 55

SP - 1784

EP - 1789

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 9-10

ER -