Stochastic analysis of deep-submicron CMOS process for reliable circuits designs

A Zjajo, Q Tang, J Pineda de Gyvez, MRCM Berkelaar, A Di Bucchianico, NP van der Meijs

Research output: Contribution to journal › Article › Scientific › peer-review

22 Citations (SciVal)

Original language	English
Pages (from-to)	164-175
Number of pages	12
Journal	IEEE Transactions on Circuits and Systems Part 1: Regular Papers
Volume	58
Issue number	1
DOIs	https://doi.org/10.1109/TCSI.2010.2055291
Publication status	Published - 2010

Keywords

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AU - Zjajo, A

AU - Tang, Q

AU - Pineda de Gyvez, J

AU - Berkelaar, MRCM

AU - Di Bucchianico, A

AU - van der Meijs, NP

PY - 2010

Y1 - 2010

KW - CWTS 0.75 <= JFIS < 2.00

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DO - 10.1109/TCSI.2010.2055291

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VL - 58

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EP - 175

JO - IEEE Transactions on Circuits and Systems Part 1: Regular Papers

JF - IEEE Transactions on Circuits and Systems Part 1: Regular Papers

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