TY - GEN
T1 - Stochastic switching and reduction of integrity in atomic force microscopy
AU - Belardinelli, Pierpaolo
AU - Lenci, Stefano
AU - Alijani, Farbod
PY - 2018
Y1 - 2018
N2 - In the presence of more than one stable state, assessment of stability is crucial for a proper device characterization. This is of particular importance in atomic force microscopy due to rich dynamics exhibited by the oscillating microcantilever probe that interacts with a sample. Indeed, the multistability can evolve in dramatic regime changes. This work aims at investigating the stochastic switching in which perturbations are responsible for shifts between alternative states with consequences in imaging and spectroscopy. The deceptively straightforward identification of the stability highlights noise-activated escapes. The barrier crossing from metastable wells in the atomic force microscopy leading to problematic configurations are observed in a variety of different configurations with the stochastic resonance as ultimate condition. Our analysis sheds light on the effect of combined additive noise and external excitation. The noise-induced erosion of the attractive domain shows a progressive reduction of the dynamical integrity of amplitude modulation atomic force microscopes.
AB - In the presence of more than one stable state, assessment of stability is crucial for a proper device characterization. This is of particular importance in atomic force microscopy due to rich dynamics exhibited by the oscillating microcantilever probe that interacts with a sample. Indeed, the multistability can evolve in dramatic regime changes. This work aims at investigating the stochastic switching in which perturbations are responsible for shifts between alternative states with consequences in imaging and spectroscopy. The deceptively straightforward identification of the stability highlights noise-activated escapes. The barrier crossing from metastable wells in the atomic force microscopy leading to problematic configurations are observed in a variety of different configurations with the stochastic resonance as ultimate condition. Our analysis sheds light on the effect of combined additive noise and external excitation. The noise-induced erosion of the attractive domain shows a progressive reduction of the dynamical integrity of amplitude modulation atomic force microscopes.
UR - http://www.scopus.com/inward/record.url?scp=85056820867&partnerID=8YFLogxK
U2 - 10.1115/DETC2018-85421
DO - 10.1115/DETC2018-85421
M3 - Conference contribution
AN - SCOPUS:85056820867
VL - 8
T3 - ASME 2018 International Design Engineering Technical Conferences & Computers and Information in Engineering Conference
BT - ASME 2018 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
PB - ASME
CY - New York, NY, USA
T2 - ASME 2018 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE 2018
Y2 - 26 August 2018 through 29 August 2018
ER -