Stochastic switching and reduction of integrity in atomic force microscopy

Pierpaolo Belardinelli*, Stefano Lenci, Farbod Alijani

*Corresponding author for this work

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Abstract

In the presence of more than one stable state, assessment of stability is crucial for a proper device characterization. This is of particular importance in atomic force microscopy due to rich dynamics exhibited by the oscillating microcantilever probe that interacts with a sample. Indeed, the multistability can evolve in dramatic regime changes. This work aims at investigating the stochastic switching in which perturbations are responsible for shifts between alternative states with consequences in imaging and spectroscopy. The deceptively straightforward identification of the stability highlights noise-activated escapes. The barrier crossing from metastable wells in the atomic force microscopy leading to problematic configurations are observed in a variety of different configurations with the stochastic resonance as ultimate condition. Our analysis sheds light on the effect of combined additive noise and external excitation. The noise-induced erosion of the attractive domain shows a progressive reduction of the dynamical integrity of amplitude modulation atomic force microscopes.

Original languageEnglish
Title of host publicationASME 2018 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
Subtitle of host publicationVolume 8: 30th Conference on Mechanical Vibration and Noise
Place of PublicationNew York, NY, USA
PublisherASME
Number of pages6
Volume8
ISBN (Electronic)9780791851852
DOIs
Publication statusPublished - 2018
EventASME 2018 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE 2018 - Quebec City, Canada
Duration: 26 Aug 201829 Aug 2018

Publication series

NameASME 2018 International Design Engineering Technical Conferences & Computers and Information in Engineering Conference
PublisherASME
Volume8

Conference

ConferenceASME 2018 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE 2018
Abbreviated titleIDETC/CIE 2018
CountryCanada
CityQuebec City
Period26/08/1829/08/18

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