Stress development and adhesion behavior in thin ceramic coatings monitored by positron annihilation during bending

R Escobar Galindo, A van Veen, H Schut, NJM Carvalho, C Strondl, ThM Hosson

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

1 Citation (Scopus)

Original language	Undefined/Unknown
Title of host publication	Materials Research Society Proceedings
Editors	C.S. Ozkan, R.C. Cammarata, L.B. Freund, H. Gao
Place of Publication	Pittsburgh, USA
Pages	L9.4/ 1-6
Publication status	Published - 2002

Name

Name
Volume	695

Keywords

@inproceedings{e5c449fdf7b143589e175eafc787a338,

title = "Stress development and adhesion behavior in thin ceramic coatings monitored by positron annihilation during bending",

keywords = "Conf.proc. > 3 pag",

author = "{Escobar Galindo}, R and {van Veen}, A and H Schut and NJM Carvalho and C Strondl and ThM Hosson",

year = "2002",

language = "Undefined/Unknown",

pages = "L9.4/ 1--6",

editor = "C.S. Ozkan and R.C. Cammarata and L.B. Freund and H. Gao",

booktitle = "Materials Research Society Proceedings",

}

Stress development and adhesion behavior in thin ceramic coatings monitored by positron annihilation during bending. / Escobar Galindo, R; van Veen, A; Schut, H et al.
Materials Research Society Proceedings. ed. / C.S. Ozkan; R.C. Cammarata; L.B. Freund; H. Gao. Pittsburgh, USA, 2002. p. L9.4/ 1-6.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Stress development and adhesion behavior in thin ceramic coatings monitored by positron annihilation during bending

AU - Escobar Galindo, R

AU - van Veen, A

AU - Schut, H

AU - Carvalho, NJM

AU - Strondl, C

AU - Hosson, ThM

PY - 2002

Y1 - 2002

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - L9.4/ 1-6

BT - Materials Research Society Proceedings

A2 - Ozkan, C.S.

A2 - Cammarata, R.C.

A2 - Freund, L.B.

A2 - Gao, H.

CY - Pittsburgh, USA

ER -