Stress in Thin Layers; Grain interaction, Elastic constants and diffraction response.

J-D Kamminga, M Leoni, U Welzel, P Lamparter, EJ Mittemeijer

Research output: Contribution to journal › Article › Scientific › peer-review

ISSN 0255-5476

Keywords

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title = "Stress in Thin Layers; Grain interaction, Elastic constants and diffraction response.",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "J-D Kamminga and M Leoni and U Welzel and P Lamparter and EJ Mittemeijer",

note = "ISSN 0255-5476",

year = "2000",

language = "Undefined/Unknown",

volume = "347-349",

pages = "42--47",

journal = "Materials Science Forum",

issn = "0255-5476",

publisher = "Trans Tech Publications",

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TY - JOUR

T1 - Stress in Thin Layers; Grain interaction, Elastic constants and diffraction response.

AU - Kamminga, J-D

AU - Leoni, M

AU - Welzel, U

AU - Lamparter, P

AU - Mittemeijer, EJ

N1 - ISSN 0255-5476

PY - 2000

Y1 - 2000

KW - ZX Int.klas.verslagjaar < 2002

M3 - Article

VL - 347-349

SP - 42

EP - 47

JO - Materials Science Forum

JF - Materials Science Forum

SN - 0255-5476

ER -